Techniniai dokumentai
Specifikacijos
Markė
NexperiaDirection Type
Bi-Directional
Diode Configuration
Series
Maximum Clamping Voltage
70V
Minimum Breakdown Voltage
25.4V
Tvirtinimo tipas
Surface Mount
Pakuotės tipas
SOT-23 (TO-236AB)
Maximum Reverse Stand-off Voltage
24V
Kaiščių skaičius
3
Peak Pulse Power Dissipation
200W
Maximum Peak Pulse Current
3A
ESD protection
Yes
Number of Elements per Chip
2
Minimali darbinė temperatūra
-65 °C
Matmenys
3 x 1.4 x 1mm
Maksimali darbinė temperatūra
+150 °C
Test Current
5mA
Maximum Reverse Leakage Current
50nA
Ilgis
3mm
Aukštis
1mm
Plotis
1.4mm
Kilmės šalis
Malaysia
Produkto aprašymas
PESD1CAN, CAN Bus ESD Protection Diode, Nexperia
PESD1CAN in a small SOT23 (TO-236AB) Surface-Mounted Device (SMD) plastic package designed to protect two automotive Controller Area Network (CAN) bus lines from the damage caused by ElectroStatic Discharge (ESD) and other transients.
Transient Voltage Suppressors, Nexperia
Sandėlio informacija laikinai nepasiekiama.
Patikrinkite dar kartą.
€ 0,228
Each (On a Reel of 3000) (be PVM)
€ 0,276
Each (On a Reel of 3000) (su PVM)
3000
€ 0,228
Each (On a Reel of 3000) (be PVM)
€ 0,276
Each (On a Reel of 3000) (su PVM)
3000
Techniniai dokumentai
Specifikacijos
Markė
NexperiaDirection Type
Bi-Directional
Diode Configuration
Series
Maximum Clamping Voltage
70V
Minimum Breakdown Voltage
25.4V
Tvirtinimo tipas
Surface Mount
Pakuotės tipas
SOT-23 (TO-236AB)
Maximum Reverse Stand-off Voltage
24V
Kaiščių skaičius
3
Peak Pulse Power Dissipation
200W
Maximum Peak Pulse Current
3A
ESD protection
Yes
Number of Elements per Chip
2
Minimali darbinė temperatūra
-65 °C
Matmenys
3 x 1.4 x 1mm
Maksimali darbinė temperatūra
+150 °C
Test Current
5mA
Maximum Reverse Leakage Current
50nA
Ilgis
3mm
Aukštis
1mm
Plotis
1.4mm
Kilmės šalis
Malaysia
Produkto aprašymas
PESD1CAN, CAN Bus ESD Protection Diode, Nexperia
PESD1CAN in a small SOT23 (TO-236AB) Surface-Mounted Device (SMD) plastic package designed to protect two automotive Controller Area Network (CAN) bus lines from the damage caused by ElectroStatic Discharge (ESD) and other transients.