Techniniai dokumentai
Specifikacijos
Markė
Texas InstrumentsNumber of Element Inputs
7
Number of Elements per Chip
1
Tvirtinimo tipas
Surface Mount
Pakuotės tipas
TSSOP
Kaiščių skaičius
48
Matmenys
12.6 x 6.2 x 1.05mm
Ilgis
12.6mm
Plotis
6.2mm
Aukštis
1.05mm
Maximum Operating Supply Voltage
3.6 V
Maksimali darbinė temperatūra
+85 °C
Minimum Operating Supply Voltage
3 V
Minimali darbinė temperatūra
-40 °C
Operating Supply Voltage Range
3 → 3.6 V
Operating Temperature Range
-40 → +85 °C
Produkto aprašymas
Addressable JTAG Port, Texas Instruments
The Texas Instruments SCANSTA111 extends the IEEE Std. 1149.1 test bus into a multi-drop test bus environment with the advantages of improved test throughput, and the ability to remove a board from the system whilst retaining test access to the remaining system modules. Each device supports up to three local IEEE 1149.1 scan rings which can be serially combined or accessed individually. A 32-bit TCK counter enables built-in self-test operations to be performed on one port while other scan chains are simultaneously tested.
Sandėlio informacija laikinai nepasiekiama.
Patikrinkite dar kartą.
€ 7,875
Each (In a Tube of 38) (be PVM)
€ 9,529
Each (In a Tube of 38) (su PVM)
38
€ 7,875
Each (In a Tube of 38) (be PVM)
€ 9,529
Each (In a Tube of 38) (su PVM)
38
Techniniai dokumentai
Specifikacijos
Markė
Texas InstrumentsNumber of Element Inputs
7
Number of Elements per Chip
1
Tvirtinimo tipas
Surface Mount
Pakuotės tipas
TSSOP
Kaiščių skaičius
48
Matmenys
12.6 x 6.2 x 1.05mm
Ilgis
12.6mm
Plotis
6.2mm
Aukštis
1.05mm
Maximum Operating Supply Voltage
3.6 V
Maksimali darbinė temperatūra
+85 °C
Minimum Operating Supply Voltage
3 V
Minimali darbinė temperatūra
-40 °C
Operating Supply Voltage Range
3 → 3.6 V
Operating Temperature Range
-40 → +85 °C
Produkto aprašymas
Addressable JTAG Port, Texas Instruments
The Texas Instruments SCANSTA111 extends the IEEE Std. 1149.1 test bus into a multi-drop test bus environment with the advantages of improved test throughput, and the ability to remove a board from the system whilst retaining test access to the remaining system modules. Each device supports up to three local IEEE 1149.1 scan rings which can be serially combined or accessed individually. A 32-bit TCK counter enables built-in self-test operations to be performed on one port while other scan chains are simultaneously tested.