Techniniai dokumentai
Specifikacijos
Markė
StaubliĮtampos reitingas
1kV
Srovės įvertinimas
1A
Spalva
Black
Probe Tip Type
Spring Loaded
Tip Size
2mm
Tip Material
Stainless Steel
Probe Socket Diameter
2mm
Maksimali darbinė temperatūra
+80°C
Minimali darbinė temperatūra
-40°C
Kilmės šalis
Switzerland
Produkto aprašymas
Shrouded Test Probes
A shrouded, safe range of 2mm products that offer an alternative to the popular 4mm range where space and size is a problem.,Meets the requirements of IEC1010-2-031, accepts the 2mm shrouded and non-shrouded plugs.
Supplied with
safety caps to prevent injury and non-slip contact of IC legs.,Rated 1000V CAT III
Warning
These test probes should NOT be used for testing circuits of more than 50Vac, unless specified otherwise. When live circuits are tested, under no circumstances should the fuse rating exceed the quoted rating of any of the test probes.
Sandėlio informacija laikinai nepasiekiama.
Patikrinkite dar kartą.
€ 9,28
už 1 vnt. (be PVM)
€ 11,23
už 1 vnt. (su PVM)
1
€ 9,28
už 1 vnt. (be PVM)
€ 11,23
už 1 vnt. (su PVM)
1
Pirkti dideliais kiekiais
kiekis | Vieneto kaina |
---|---|
1 - 4 | € 9,28 |
5 - 9 | € 8,37 |
10+ | € 7,46 |
Techniniai dokumentai
Specifikacijos
Markė
StaubliĮtampos reitingas
1kV
Srovės įvertinimas
1A
Spalva
Black
Probe Tip Type
Spring Loaded
Tip Size
2mm
Tip Material
Stainless Steel
Probe Socket Diameter
2mm
Maksimali darbinė temperatūra
+80°C
Minimali darbinė temperatūra
-40°C
Kilmės šalis
Switzerland
Produkto aprašymas
Shrouded Test Probes
A shrouded, safe range of 2mm products that offer an alternative to the popular 4mm range where space and size is a problem.,Meets the requirements of IEC1010-2-031, accepts the 2mm shrouded and non-shrouded plugs.
Supplied with
safety caps to prevent injury and non-slip contact of IC legs.,Rated 1000V CAT III
Warning
These test probes should NOT be used for testing circuits of more than 50Vac, unless specified otherwise. When live circuits are tested, under no circumstances should the fuse rating exceed the quoted rating of any of the test probes.